KIT33905BD3EVBE,2315710,Evaluation Kit for MC33905D3 System Basis Chip Gen2 with High Speed CAN and LIN Interface,NXP
laird代理商
专业代理销售laird(莱尔德)全系列产品-新加坡2号仓库
美国1号分类选型新加坡2号分类选型英国10号分类选型英国2号分类选型日本5号分类选型

在本站结果里搜索:    
热门搜索词:28B0500-100  IRF9540  保险丝  amphenol  4.7μF 63V 5mm  P沟道 8ohm SOT-23  2581138

KIT33905BD3EVBE - 

Evaluation Kit for MC33905D3 System Basis Chip Gen2 with High Speed CAN and LIN Interface

NXP KIT33905BD3EVBE
声明:图片仅供参考,请以实物为准!
制造商:
NXP NXP
制造商产品编号:
KIT33905BD3EVBE
仓库库存编号:
2315710
技术数据表:
(EN)
订购热线: 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于产品数据库庞大,部分产品信息可能未能及时更新,下单前请与销售人员确认好实时在库数量,谢谢合作!

KIT33905BD3EVBE产品概述

The KIT33905BD3EVBE is a 33905BD3, System Basis Chip Gen2 with High Speed CAN and LIN Interface evaluation board. This evaluation board allows the user to implement the functionality of the 33905BD3 System Basis Chips (SBC), which are the second generation family of System Basis Chips, which combine several features and enhance present module designs. The devices work as an advanced power management unit for the MCU and additional integrated circuits such as sensors, CAN transceivers. They have a built-in enhanced high speed CAN interface (ISO11898-2 and -5), with local and bus failure diagnostics, protection, and fail safe operation mode. The SBCs may include one or two LIN 2.0 interfaces with LIN output pin switches. The 33905 include 2 or 3 wake up input pins than can also be configured as output drivers for flexibility.
  • Nominal operating supply voltage range of 5.5V to 27V
  • 5V/3.3V regulator for the MCU with an external PNP ballast transistor to increase current capability
  • Multiple CAN Bus termination options supported via socket
  • Two high/low side I/O (SPI configurable) accessible through a test point
  • Status of I/O-0 and I/O-1 indicated by an LED (dependent on jumper configuration)
  • Debug mode/watchdog configuration via jumper settings
  • MUX output voltage accessible through a test point and external resistor selectable through a jumper
  • I_WAKE_I test point to enable a FET and load VDD with current to wake up the SBC
  • LIN1_T and LIN2_T test points to monitor I/O voltages (SPI configurable)
  • 100mil 2x8 pin standard header connector for SPI communication

通信与网络, 车用

KIT33905BD3EVBE产品信息

  套件应用类型  通信和网络  
  应用系统子类型  CAN 与 LIN 接口  
  硅芯制造商  NXP  
  硅芯号  MC33905  
  产品范围  -  
  套件包含  Evaluation Board MC33905, User Guide, Schematic, Software  
关键词         

KIT33905BD3EVBE关联产品

  • 制造商产品编号
  • 仓库库存编号
  • 制造商 / 说明 / 规格书
  • 操作
电话:400-900-3095
QQ:800152669

KIT33905BD3EVBE产地与重量

原产地:
United States

进行最后一道重要生产流程所在的国家

RoHS 合规:
税则号:
84733020
重量(千克):
.277145
laird电子简介 | laird产品 | laird动态 | 按系列选型 | 按产品规格选型 | laird产品应用 | laird选型手册
Copyright © 2017 www.laird-tek.com All Rights Reserved. 技术支持:电子元器件 ICP备案证书号:粤ICP备11103613号
版权所有:深圳市创唯电子有限公司 客服电话:400-900-3095 企业QQ:800152669 邮箱:sales@szcwdz.com